The main theme of my research interests is the application of hard x-rays to the characterization of materials. This research theme covers a variety of past and current projects, including the study of surfaces, interfaces, thin film materials and interfaces for the electronics industry, and some biomaterials. A secondary research theme also covers the  study of new types of optics that improve the methods for hard x-ray characterization here and here.

As a beamline scientist, my primary task is to support a collection of user groups that are interested in the in-situ study of growing surfaces and interfaces. We, the ISR beamline staff, support these user groups in the ISR D-hutch, a hutch that is optimized to these kinds of problems. I was a member of the team that designed, managed the construction, and commissioned the ISR beamline. Examples of user publications for this in-situ growth effort are here and here.

My expertise is in X-ray diffraction from surfaces, interfaces and thin films, and X-ray Optics.

I obtained my Ph.D. in Physics in 1989, and two B.S. degrees in Physics and Electrical Engineering in 1985, all from the Massachusetts Institute of Technology (MIT)